Interface Science -

Surface Imaging

Imaging of Lattice Defects

The Field Ion Microscope (FIM) allows the investigation of lattice defects in pure metal crystals and alloys with atomic resolution. The characteristic image contrast results from the intersection of the hemispherical envelope of the tip apex with the parallel stack of the netplanes. The bright spots are the image of individual atoms. 

FIM of Pt
Nearly perfect Pt single crystal tip, (111)- oriented, 
He ion image at  20 K
FIM of W
High angle grain boundary in W, He ion image at 78 K
FIM of Steel
Perfect dislocation in a high strength low alloy steel on top of the (011) plane

Next         Back