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The Scanning Tunneling Microscope (STM) in the left is directly mounted to the FIM-Atom Probe. In the background a separate preparation chamber is attached. The samples can be introduced by a vacuum interlock with transfer rod (foreground). The unique feature of this apparatus is that the probe tip for the STM can be characterized before and after the scan by FIM and Atom probe under ultra-high vacuum conditions and consequences of the tip surface interaction can be investigated.
