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Teaching Activities

 

Graz University of Technology – lectures and labs

winter semester:
• Einführung Studium Technische Physik (LV-No.: 513.099) lecture
• Messtechnik – Messsysteme (LV-No.: 513.147) lecture
• Angewandte Physik Praktikum (LV-No.: 513.012), practical training
• Praktikum Halbleiter-u.Oberflächenphys.1 (LV-No.: 513.010) practical training
• Praktikum Halbleiter-u.Oberflächenphys.2 (LV-No.: 513.011) practical training
• Organische Materialien&Strukturunters.1 (LV-No.: 513.046) privatissimum
• Seminar Neuartige Materialien 1 (LV-No.: 513.026) seminar

summer semester:
• Organic Semiconductors – Fundamentals and Applications (LV-No.: 513.041) lecture
• Angewandte Physik Praktikum (LV-No.: 513.012), practical training
• Praktikum Halbleiter- und Oberflächenphysik 1 (LV-No.: 513.010) practical training
• Praktikum Halbleiter-und Oberflächenphysik 2 (LV-No.: 513.011) practical training
• Organische Materialien&Strukturuntersuchungen 2 (LV-No.: 513.047) privatissimum
• Seminar Neuartige Materialien 2 (LV-No.: 513.029) seminar

 

Ph.D thesis

Structural properties of polyacenes
Martin Oehzelt, current project

Growth of thin films by Hot Wall Epitaxy
Ondrej Lengyel, current project

 

Master thesis

Epitaxial order of sexiphenyl on inorganic substrates
Thomas Haber, current project

Structural properties of polyacenes under high pressure
Andreas Aicholzer, current project

Structural order in epitaxially grown oligo-phenylene thin films on metallic surfaces
Ingo Salzmann, January 2003

Influence of temperature to residual strain in thin Aluminium films on silicon
Ernst Eiper, January 2003

Specification of a heating stage for 4-circle X-ray diffractometer
Eduard Tamas, September 2002

Structural characterisation of highly ordered para-sexiphenyl thin films
Harald Plank, March 2002

Structural changes of anthracene under high pressure
Martin Oehzelt, February 2002

Quantitative phase analysis on steel alloys by x-ray diffraction
Sabine Purger, May 2000

Development of a high temperature attachment for x-ray texture goniometers
Bernhard Sonderegger, November 2000

Structural investigations of hexaphenyl thin films
Kurt Erlacher, August 1999

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