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From Grazing Incidence Diffraction to Pole Figures and Epitaxy Grazing incidence X-ray diffraction (GIXD) is an experimental method frequently applied to characterize thin films and surfaces. Depending on the texture of the sample’s crystallites, special care is required during the experimental measurements and successive data evaluation. For example, epitaxially grown samples with defined in-plane alignment of the crystallites require a full sample rotation around the surface normal during data collection. This is necessary to obtain all information for phase, texture and epitaxy analysis. To fully take advantage of the data obtained during this rotation, pole figures can be calculated. In this talk, two examples are presented to illustrate the importance of the rotation: In the first example, the molecule pentacenequinone (P2O) on a Au(111) surface is studied and its crystal structure is determined. In a subsequent step, GIXD pole figures are used to evaluate the epitaxial relationships between the film and the substrate. Applying the experimental technique to a metal organic framework (MOF) on a Copper hydroxide nanobelt surface allows to study the alignment of the nanobelts and if the alignment from the surface is transferred to the MOF. |