Institute of Solid State Physics


SS22WS22SS23WS23SS24WS24      Guidelines for Master Students

Automatic Peak Finder
Clemens Tschernay
11:15 - 12:15 Wednesday 11 December 2019 PH 01 150

Grazing Incident X-Ray Diffraction (GIXD) is a widely used tool to analyse crystalline thin films. For the evaluation of GIXD data the position of the diffraction spots is of great importance. So an accurate procedure to find diffraction peaks with their exact position is of utmost interest. In this talk a specific procedure for peak finding is introduced and the software Automatic Peak Finder (APF) is developed. Automatic peak finding together with manual corrections is possible of 2—dimensional GIXD data as well as of rotational GIXD data probing large volumes of the reciprocal space. The procedure is introduced on a number of examples: epitaxially grown molecular crystals at single crystalline surfaces and metal-organic frameworks at isotropic surfaces.