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SS22 WS22 SS23 WS23 SS24 WS24 Guidelines for Master Students
Automatic Peak Finder Grazing Incident X-Ray Diffraction (GIXD) is a widely used tool to analyse crystalline thin films. For the evaluation of GIXD data the position of the diffraction spots is of great importance. So an accurate procedure to find diffraction peaks with their exact position is of utmost interest. In this talk a specific procedure for peak finding is introduced and the software Automatic Peak Finder (APF) is developed. Automatic peak finding together with manual corrections is possible of 2—dimensional GIXD data as well as of rotational GIXD data probing large volumes of the reciprocal space. The procedure is introduced on a number of examples: epitaxially grown molecular crystals at single crystalline surfaces and metal-organic frameworks at isotropic surfaces. |