Institute of Solid State Physics

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Crystallographic real structure: characterization by X-ray methods
Roland Resel
11:15 - 12:15 Wednesday 14 October 2020 

Video: https://bigmail.tugraz.at/outgoing/roland_resel_111046_622/3353_de.html

The talk gives a short introduction to the different types of deviation from the ideal crystal structure. An overview about crystal defects at different length scales are given together with specific examples on the characterization of defects by X-ray diffraction method. A detailed de>ion is given of the size/strain method and the applicability to thin films of the molecule phenyl-benzothienobenzothiophene-decyl is discussed. Since the observed peak broadening phenomena cannot be explained in a reasonable way, simulations of the diffraction pattern based on a crystal structure with molecular disorder are performed.