|
SS22 WS22 SS23 WS23 SS24 WS24 Guidelines for Master Students
Early life failure mechanisms detection in power MOSFETs by means of thermal burn-in One of the key challenges for manufacturers is the reliability of the ICs when built into the customer’s application. Therefore, the semiconductor devices integrated in these ICs, need to work exactly as supposed to. A more prominent effect in this context is the so-called bathtub curve, which describes the fact that most defects and failures in such devices are occurring at the beginning of the lifetime of the chip, rather than after several years of operation. |