Grazing Incidence X-Ray Diffraction to Characterize Organic Thin Films
Grazing incidence x-ray diffraction is a powerful tool to investigate crystallographic structures of thin organic films. In these films organic molecules have a tendency to form crystal structures that differ from the bulk equilibrium structures, i.e. structures of macroscopic single crystals. These thin-film structures are crystal phases which are induced due to the presence of a surface during the thin-film growth. Because of that these structures are not accessible via single crystal or powder diffraction. In this presentation a method will be shown, with which it is possible to solve crystal structures from data which can be obtained from thin films.