Grazing Incidence X-Ray Diffraction to Characterize Organic Thin Films
Armin Moser
16:00 - 17:00 Tuesday 18 January 2011 KFU

Grazing incidence x-ray diffraction is a powerful tool to investigate crystallographic structures of thin organic films. In these films organic molecules have a tendency to form crystal structures that differ from the bulk equilibrium structures, i.e. structures of macroscopic single crystals. These thin-film structures are crystal phases which are induced due to the presence of a surface during the thin-film growth. Because of that these structures are not accessible via single crystal or powder diffraction. In this presentation a method will be shown, with which it is possible to solve crystal structures from data which can be obtained from thin films.

Additionally the influence of organic dielectrics - often used to tune device parameters - onto the crystallographic structure and morphology of pentacene thin films will be shown. It is revealed that the surface energies of the dielectrics have a tremendous influence onto the thin film.

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