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X-ray reflectivity – software test | ||
The optical reflection of X-ray at surfaces is a useful tool to characterize surfaces and thin films. The work will include the performance of a series of X-ray reflectivity measurements of various samples. The experimental data will be analyzed by using three different software packages: X’Pert Reflectivity, GenX and refnx. The work should demonstrate the usability of the recently developed software refnx. | ||
Institute of Solid State Physics
