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The optical reflection of X-ray at surfaces is a useful tool to characterize surfaces and thin films. The work will include the performance of a series of X-ray reflectivity measurements of various samples. The experimental data will be analyzed by using three different software packages: X’Pert Reflectivity,X-ray Hub Reflectivity and refnx. The work should demonstrate the usability of the recently developed software refnx.
The candidate will lean to operate state of the art laboratory machines for data acquisition and the related evaluation of the data by different software packages.
The work is performed in close collaboration with the company Anton Paar
contact: Roland Resel (roland.resel@tugraz.at)
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Institute of Solid State Physics
