Institute of Solid State Physics

Roland Resel

Contact: ☎ ✉

People in the Resel group
 Anmol Andotra
 Prabhu Prasad Biswal
 Alexander Bottaro
 Elisa Collet
 Mario Fratschko
 Fabian  Gasser
 Ann Maria James
 Sanjay John
 Josef Simbrunner
 Guilia Tamburini

   Embedded-dipole self-assembled monolayers tune contact resistances in p‐type and n‐type organic transistors

Master projects available
   Preparation of a photonic single crystal
   Proof of surface crystallisation for anthraquinone

Bachelor projects available
   X-ray reflectivity – software test
   Relaunch of the software STEREOPOLE
   Self-similar surfaces in foams?

   FWF: Crystal Structure Solution from Thin Organic Films
   FRNS/FWO: 2Dto3D
   FWF: Thin Film Polymorphism of Copper Based Metal-Organic Frameworks
   Horizon 2020: Ultra-high Charge Carrier Mobility to Elucidate Transport Mechanisms in Molecular Semiconductors

    PHT.309UF Soft Matter Physics
   513.120 Solid State Physics Laboratory Exercises
   513.123 Bachelor Project
   513.127 513.128 Seminar Solid State Physics
   PHT.309UF X-ray and neutron scattering

research highlight - The method of polymorph screening can be substantially improved by including substrate surfaces as templates for crystallization. This is important especially in case of thin film applications for a specific molecular material. The crystallization at surfaces have to be taken into account to identify the relevant phases.

Polymorph Screening at Surfaces of a Benzothieno-Benzothiophene Derivative: Discovering New Solvate Forms :
>A. M: James, et al., Materials Horizons (2023)<<

Video: Houska price 2015

Radio Oe1: Wissen aktuell - 10. August 2009

software development :
GIDVis - A modular MATLAB program to analyze grazing incidence diffraction images
GIDInd - A MATLAB program to index grazing incidence diffraction images
Stereopole - a software for the analysis of x-ray diffraction pole figures with IDL was developed,
and can be >> downloaded << free of charge. Please install first the IDL Virtual Machine.
(see: I. Salzmann and R. Resel, Journal of Applied Crystallography, vol. 37, p. 1029, 2004.)