research highlight
- Grazing Incidence X-ray Diffraction (GIXD) is the tool of choice for the crystallographic characterisation of thin films. Besides the use of peak positions also exact peak intensities are important for data analysis. This work provides tools to determine geometric factors which influence the intensity of diffraction peaks. This work shows how reliable structure factors can be determined from GIXD experiments.
review paper:
Intensity corrections for grazing incidence X-ray diffraction of thin films using static area detectors
>F. Gasser, et al., Journal of Applied Crystallography 2025 <<
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Institute of Solid State Physics
