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research highlight
- Material properties frequently relate to structures at or near surfaces,
particularly in thin films. As a result, it is essential to understand these
structures at the molecular and atomistic levels. The most accurate and
widely used techniques for characterizing crystallographic order are
based on X-ray diffraction. This review paper compiles information relevant to perform high-quality grazing incidence X-ray diffraction experiments, evaluate data and interpret results, to extend knowledge about X-ray diffraction from surfaces, interfaces
and thin films.
review paper:
X-ray diffraction under grazing incidence conditions
>O. Werzer et al., Nature Reviews Methods Primers (2024) <<
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Institute of Solid State Physics
