Institute of Solid State Physics
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SS23 WS23 SS24 WS24 SS25 Guidelines for Master Students
Structural characterization of organic semiconductor thin films using infrared spectroscopy and X-ray diffraction Molecular semiconductors have unique structural properties in thin films, which play a decisive role in determining the material properties in thin-film devices. Therefore, analysis and control of the aggregation structure are of great importance for the development of high-performance electronic devices. For this purpose, a combination of infrared spectroscopy and X-ray diffraction can be used to reveal the molecular orientation and packing in thin films. In this seminar, I will present our recent studies using this technique to analyze the film structure of several molecular semiconductors [1-3]. |
