Institute of Solid State Physics
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SS22 WS22 SS23 WS23 SS24 WS24 Guidelines for Master Students
Impact of Sample Misalignment on Grazing Incidence X-ray Diffraction Patterns and the resulting Unit Cell Determination Grazing incidence X-ray diffraction pattern is used as a method for crystalline characterization of thin films. To obtain a qualitative result it is necessary to align the sample correctly. Reasons for an incorrect alignment can be a wrong height setting, a wrong angle of incidence or a not flat lying sample. The aim of this work is to determine the influence and the error of the misalignment to get a good estimation of the quality of the measured diffraction pattern. |
